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This paper presents a new and comprehensive low-power test scheme compatible with a test compression environment. The key contribution of this paper is a flexible test-application framework that achieves significant reductions in switching activity during all phases of scan test: loading, capture, and unloading. In particular, we introduce a new on-chip(More)
The paper presents a novel low power test scheme integrated with the embedded deterministic test environment. It reduces significantly switching rates in scan chains with minimal hardware modification. Experimental results obtained for industrial circuits clearly indicate that switching activity can be reduced up to 150 times along with improved compression(More)
This paper presents a new low-power test scheme integrated with the embedded deterministic test environment. The key contribution of this paper is a flexible test cube encoding scheme, which, in conjunction with a continuous flow decompressor, allows one to significantly reduce toggling rates when test patterns are fed into scan chains. The proposed(More)
The embedded deterministic test-based compression uses cube merging to reduce a pattern count, the amount of test data, and test time. It gradually expands a test pattern by incorporating compatible test cubes. This paper demonstrates that compression ratios can be order of magnitude higher, if the cube merging continues despite conflicts on certain(More)
—The presented compression scheme is a novel solution that is based on deterministic vector clustering and encompasses three data reduction features in one on-chip decoding system. The approach preserves all benefits of continuous flow decompression and offers compression ratios of order 1000x with encoding efficiency much higher than 1.00. 1. Introduction(More)
<para> Unknown (X) states are increasingly often identified as having potential for rendering semiconductor tests useless. One of the key requirements for a reliable test response compactor is, therefore, to preserve observability of any scan cell for a wide range of X-profiles while maintaining very high-compaction ratios, providing ability to detect a(More)