Damian Grzechca

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This paper discusses the basic concept of analog recognition techniques), have been known for almost 20 functional test approach. Recently, most on going research has years, however their practical utilization is of no great been focused on distinguishing faulty or healthy circuit-from importance [1]. Limitation to catastrophic faults and fault the(More)
—The new approach to edge detection is presented in this paper. The proposed method uses genetic programming (GP) to search for digital transfer function of image edge detector. The found function can be easily implemented to any programmable logic device (PLD) that allows to build a fast system of image processing. I. INTRODUCTION Local discontinuities in(More)
This paper presents an analysis of an influence of with Simulation Before Test method. The diagnosis system global parametric faults (GPF) on analogue integrated circuits may be applied on a prototype stage of AIC production. (AIC) time domain (TD) response features, such as overshoot, Global parametric faults, in presented research, have been delay time,(More)