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A Practical Guide to Trusted Computing
- D. Challener, Kent Yoder, Ryan Charles Catherman, David R. Safford, L. V. Doorn
- Computer Science
- 27 December 2007
Authored by innovators who helped create TPM and implement its leading-edge products, this practical book covers all facets of TPM technology: what it can achieve, how it works, and how to write applications for it.
A Practical Guide to TPM 2.0
The book seeks to empower and excite the programming community to use TPMs to help solve the current general security crisis and to educate the general public about TPM 2.0.
Autonomic personal computing
This paper identifies the key technologies that enable autonomic behavior as distinguished from fault-tolerant behavior and gives some general considerations for an architecture that supports autonomic personal computing.
A Practical Guide to TPM 2.0: Using the Trusted Platform Module in the New Age of Security
A Practical Guide to TPM 2.0: Using the Trusted Platform Module in the New Age of Security explains security concepts, describes the TPM2.0 architecture, and provides code and pseudo-code examples in parallel, from very simple concepts and code to highly complex concepts and Pseudo-code.
Catching the Cuckoo: Verifying TPM Proximity Using a Quote Timing Side-Channel - (Short Paper)
A timing model for the Cuckoo attack is described, and experimental results that demonstrate the feasibility of using timing to detect the Cuckedoo attack over practical levels of adversary link speeds are demonstrated.
Trusted Platform Module Evolution
This article presents TPM use cases and explains the motivation for the major changes made to improve the TPM specification.
Human Ear Recognition
Platform Security Technologies That Use TPM 2.0
The author’s attempts to keep the book interesting were successful…or you’re extraordinarily persistent…or maybe you just cheated and skipped to the conclusion.
History of the TPM
Kinetic study of electromigration failure in Cr/Al-Cu thin film conductors covered with polyimide and the problem of the stress dependent activation energy
- J. Lloyd, M. Shatzkes, D. Challener
- Materials Science26th Annual Proceedings Reliability Physics…
- 12 April 1988
The electromigration lifetime of Cr/Al-Cu conductors covered with polyimide passivation was studied as a function of temperature and current density. The activation energy for failure was found to be…