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Vertical ReRAM (VRRAM) has been realized with modification of Vertical NAND (VNAND) process and architecture as a cost-effective and extensible technology for future mass data storage. Dedicated ALD/CVD deposition and wet etching processes were developed to reproduce planar ReRAM properties in VRRAM structure. Multi-stack of VRRAM cell layers were(More)
The bottle neck of ReRAM (Resistive RAM) for post-NAND storage application is high operational current [1,2]. Herein, we report a method to acquire low operational currents from a hetero structure ReRAM (AlOx/TiOx). The mechanism study of the hetero structure ReRAM reveals that the AlOx layer as a tunnel barrier is critical for switching, and thus switching(More)
Resistance random access memory (ReRAM) has attracted great attention due to their drastically reduced power consumption, fast switching speed, and nondestructive readouts [1]. However, non-uniformity and reliability issue are still considered as barriers for future high density memory applications. To solve these issues, our group proposed single crystal(More)
Resistive Random Access Memory (RRAM) had received great amount of attention from various research efforts in recent years, owing to its promising performance as a next generation memory device. In this paper, samples based on TiN/HfOx/Pt stack were prepared and its electrical switching behaviors were characterized and discussed in brief. Keywords—HfOx,(More)
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