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We systematically measure the dielectric function of atomically thin MoS2 films with different layer numbers and demonstrate that excitonic effects play a dominant role in the dielectric function when the films are less than 5-7 layers thick. The dielectric function shows an anomalous dependence on the layer number. It decreases with the layer number(More)
This paper uses X-ray absorption spectroscopy to study the electronic structure of the high-k gate dielectrics including TM and RE oxides. The results are applicable to TM and rare earth (RE) silicate and aluminate alloys, as well as complex oxides comprised of mixed TM/TM and TM/RE oxides. These studies identify the nature of the lowest conduction band d *(More)
I meant no harm, I promise. In the last issue of Radiations, I wanted to refer to the author of our cover story a second time; I reflexively chose to use " Ms. Tannenwald, " feeling rather virtuous that I didn't blurt out " Miss " or " Mrs. " What does it say about me that I didn't stop when selecting an appropriate title to consider that she is an(More)
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