Total ionizing dose (>1 Mrad(Si)) and SEE test results at two commercial foundries for a 0.25 /spl mu/m radhard-by-design ASIC are reported in this paper. Radhard-by-design techniques provide denser, faster and lower power space applications.
UNLABELLED A methicillin-resistant Staphylococcus aureus (MRSA) clone known as ST398 has emerged as a major cause of acute infections in individuals who have close contact with livestock. More recently, the emergence of an animal-independent ST398 methicillin-sensitive S. aureus (MSSA) clone has been documented in several countries. However, the limited… (More)
BACKGROUND Community-associated methicillin-resistant Staphylococcus aureus (CA-MRSA) infections are spreading, but the source of infections in non-epidemic settings remains poorly defined. METHODS We carried out a community-based, case-control study investigating socio-demographic risk factors and infectious reservoirs associated with MRSA infections.… (More)
Staphylococcus aureus infections continue to pose a global public health problem. Frequently, this epidemic is driven by the successful spread of single S. aureus clones within a geographic region, but international travel has been recognized as a potential risk factor for S. aureus infections. To study the molecular epidemiology of S. aureus infections in… (More)
BACKGROUND The household is a recognized community reservoir for Staphylococcus aureus. This study investigated potential risk factors for intra-household S. aureus transmission, including the contribution of environmental contamination. METHODS We investigated intra-household S. aureus transmission using a sample of multiple member households from a… (More)
Intrinsic and RadHard-by-Design hardness characterization has been performed on a 130 nm fab process. Hardness results from test chips produced in phase II of a NASA Goddard Space Flight Center contract are presented.
Radhard-by-design has been advanced by embedding EDAC into a 16Mbit SRAM to harden the SRAM against single event upset. Conventional radhard-by-design techniques are used for the non-memory circuitry. The estimated uncorrectable double bit error rate is 2.9 times 10<sup>-16 </sup> errors/bit-day assuming a geosynchronous orbit, the Adam's 90% worst case… (More)
Diverse strain types of methicillin-resistant Staphylococcus aureus (MRSA) cause infections in community settings worldwide. To examine heterogeneity of spread within households and to identify common risk factors for household transmission across settings, primary data from studies conducted in New York (USA), Breda (The Netherlands), and Melbourne… (More)
Special SEU test software is used to monitor the SEUs corrected by fault tolerant circuitry in the internal SRAM of the LEON 3FT processor. SEL immunity, SEU, and TID results are reviewed.
A high density 64/80/96-Mbit SSRAM has been designed, manufactured, and characterized for radiation effects. The device is SEL immune, has an error rate less than 1x10-15 errors/bit-day, and is TID tolerant to 100 krad(Si).