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Significant new mechanical and electronic phenomena can arise in single-crystal semiconductors when their thickness reaches nanometer dimensions, where the two surfaces of the crystal are physically close enough to each other that what happens at one surface influences what happens at the other. We show experimentally that, in silicon nanomembranes,(More)
The influence of in-plane biaxial strain on the conduction bands of Si is explored using elastically strained Si(001) nanomembranes and high-resolution x-ray absorption measurements with electron yield detection. The strain-induced splitting of the conduction band minimum and the energy shifts of two higher conduction bands near L1 and L3 are clearly(More)
Freestanding, ultracompliant crystalline-sheet substrates provide a new opportunity to control the growth of strained epitaxial films. Three-dimensional SiGe islands grown on thin silicon nanomembranes self-order as the strain field induced by initial island growth guides nucleation of subsequent islands on the opposite surface. A mechanics analysis(More)
Integrated freestanding single-crystal silicon nanowires with typical dimension of 100 nm × 100 nm × 5 µm are fabricated by conventional 1:1 optical lithography and wet chemical silicon etching. The fabrication procedure can lead to wafer-scale integration of silicon nanowires in arrays. The measured electrical transport characteristics of the silicon(More)
Epitaxial growth of self-assembled quantum dots (QDs) on single-crystal nanomembranes yields organized arrays of QDs via a growth mode mediated by QD-induced strains in the membrane. A crucial aspect of this effect arises because epitaxial growth on thin Si sheets and nanostructures derived from them can occur simultaneously on two surfaces separated only(More)
The flexibility of single-crystal Si nanomembranes allows strain to be applied elastically without introducing dislocations in the fabrication process, resulting in uniform strain. It is also relatively easier to apply different types and orientations of strain to Si using elastic-strain sharing than by the traditional graded-strained-layer approach. We use(More)
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