Chunli Diao

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Ba<sub>0.4</sub>Sr<sub>0.6</sub>TiO<sub>3</sub> (BST) thin films were prepared by spin-coating technique and deposited on either Pt/TiO<sub>2</sub>/SiO<sub>2</sub>/Si (Pt/Si) substrate or silicon buffered by a lanthanum nickel oxide buffer layer (LNO/Si). X-ray diffraction and scanning electron microscopy showed that the BST films were crack free, compact(More)
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