Chun Ming Jimmy Tsai

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Wearable hip protectors (padded garments) represent a promising strategy to decrease impact force and hip fracture risk during falls, and a wide range of products are currently marketed. However, little is known about how design features of hip protectors influence biomechanical effectiveness. We used a mechanical test system (simulating sideways falls) to(More)
A novel solution is presented for dielectric and silicon etching when using Focused ion beam (FIB) for circuit edit (CE). In contrast to commonly used XeF2, the new solution has a significantly higher activation threshold that allows it to be used for etching new sensitive low-k dielectrics and even thin silicon without the risk of damaging these materials(More)
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