Chuijie Yi

We don’t have enough information about this author to calculate their statistics. If you think this is an error let us know.
Learn More
The test platform of wheat precision seeding based on image processing techniques is designed to develop the wheat precision seed metering device with high efficiency and precision. Using image processing techniques, this platform gathers images of seeds ( wheat ) on the conveyer belt which are falling from seed metering device. Then these data are(More)
  • 1