Chuen-Song Chen

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An indirect current sensing technique for <i>I<inf>DDQ</inf></i> and <i>I<inf>DDT</inf></i> tests is proposed in this paper. This is accomplished by utilizing the pervasive on-chip voltage regulators and thus have little or no impact on CUT's design and its performance. We demonstrate that the proposed technique can be applied to both <i>I<inf>DDQ</inf></i>(More)
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