Christopher K. C. Yap

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Wafer warpage is common in microelectronics processing. Warped wafers can affect device performance, reliability and linewidth control in various processing steps. We proposed in this paper an in-situ fault detection technique for wafer warpage in lithography. Early detection will minimize cost and processing time. Based on first principle thermal modeling,(More)
AdBot is a computerized advertisement monitoring system for TV and Radio broadcasts based on the Robust Landmark-Based Audio Fingerprinting algorithm. Landmarks are areas in an audio segment with high frequency concentration that are likely to survive even in the presence of noise or distortion. Each extracted landmark is converted into a hash value by(More)
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