Christian Brauer-Burchardt

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The interface roughness of multilayer coatings consisting of ultra thin alternating layers strongly influences the optical properties of dielectric mirrors. However, the technical possibilities for its characterization are limited. In this paper a new method for roughness determination of multilayer systems based on cross-section images is introduced. The(More)
A new methodology for parameter free lens distortion determination is introduced providing high precision capacity and low effort by omission of subsequent camera calibration. It uses a plane grid pattern with precise geometry. The method is based on the iterative estimation of the distortion using several views from different observation positions by(More)
A new methodology is presented which enables the use of optical free-forms instead of classical beamers for fringe projection based optical 3D surface measurements. Although optical free-forms allow the generation of approximately sinusoidal fringes for phase shifting profilometry, they cannot produce Gray code like pattern for robust phase unwrapping. The(More)
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