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This paper presents a state-of-the-art review of error-correcting codes for computer semiconductor memory applications. The construction of four classes of error-correcting codes appropriate for semiconductor memory designs is described, and for each class of codes the number of check bits required for commonly used data lengths is provided. The(More)
A significant improvement in memory fault tolerance, beyond what is already provided by the use of an appropriate error-correcting code (ECC), can be achieved by electronic chip swapping, without any compromise of data integrity as large numbers of faults are allowed to accumulate. Since most large and medium-sized semiconductor memories are organized so(More)