Chiiho Sano

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We present a method of test generation for acyclic sequential circuits with <i>hold</i> registers. A <i>complete (100% fault efficiency)</i> test sequence for an acyclic sequential circuit can be obtained by applying a <i>combinational</i> test generator to all the <i>maximal time-expansion models (TEMs)</i> of the circuit. We propose a class of acyclic(More)
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