Chih Chen

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Three dimensional thermo-electrical analysis was employed to simulate the current density and temperature distributions for eutectic SnAg solder bumps with shrinkage bump sizes. It was found that the current crowding effects in the solder were reduced significantly for smaller solder joints. Hot-spot temperatures and thermal gradient were increased upon(More)
We investigate the growth of Cu films on two different Cu seed layers: one with regular <111>-oriented grains and the other with very strong <111>-preferred orientation. It is found that densely-packed nanotwinned Cu (nt-Cu) can be grown by pulsed electroplating on the strong <111>-oriented Cu seed layer without a randomly-oriented transition layer between(More)
As microelectronic industry develops 3D IC on the basis of through-Si-vias (TSV) technology, the processing and reliability of microbumps, which are used to interconnect the stacking chips, is being actively investigated. Due to the reduction in size of microbumps, the diameter is about one order of magnitude smaller than that of flip chip solder joints,(More)
The heterojunction effects of TiO2 nanotubes on photoconductive characteristics were investigated. For ITO/TiO2/Si diodes, the photocurrent is controlled either by the TiO2/Si heterojunction (p-n junction) or the ITO-TiO2 heterojunction (Schottky contact). In the short circuit (approximately 0 V) condition, the TiO2-Si heterojunction dominates the(More)
Electromigration tests of SnAg solder bump samples with 15 µm bump height and Cu under-bump-metallization (UBM) were performed. The test conditions were 1.45ˆ10 4 A/cm 2 at 185 ˝ C and 1.20ˆ10 4 A/cm 2 at 0 ˝ C. A porous Cu 3 Sn intermetallic compound (IMC) structure was observed to form within the bumps after several hundred hours of current stressing. In(More)
Direct Cu-to-Cu bonding was achieved at temperatures of 150-250 °C using a compressive stress of 100 psi (0.69 MPa) held for 10-60 min at 10(-3) torr. The key controlling parameter for direct bonding is rapid surface diffusion on (111) surface of Cu. Instead of using (111) oriented single crystal of Cu, oriented (111) texture of extremely high degree,(More)
To keep up with the demand of continuous increase in device densities, the integration of three-dimensional integrated circuits (3D-IC) has become the most probable solution, and the utilization of ultra-fine-pitch microbump has emerged as an essential component of 3D-IC technology. In this study, a Kelvin bump structure was fabricated and resistances(More)
Continuous-wave green laser-crystallized (CLC) single-grain-like polycrystalline silicon n-channel thin-film transistors (poly-Si n-TFTs) demonstrate the higher electron mobility and turn-on current than exci-mer laser annealing (ELA) poly-Si n-TFTs. Furthermore, high drain voltage accelerates the flowing electrons in n-type channel, and hence the(More)
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