Chia-Yi Lin

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This paper reports a versatile nano-sensor technology using "top-down" poly-silicon nanowire field-effect transistors (FETs) in the conventional Complementary Metal-Oxide Semiconductor (CMOS)-compatible semiconductor process. The nanowire manufacturing technique reduced nanowire width scaling to 50 nm without use of extra lithography equipment, and(More)
This paper proposes a selective pattern-compression scheme to minimize both test power and test data volume during scan-based testing. The proposed scheme will selectively supply the test patterns either through the <i>compressed scan chain</i> whose scanned values will be decoded to the original scan cells, or directly through the original scan chain using(More)
This paper presents a performance based comparative study of various fuzzy logic controllers (FLCs) to control the speed of squirrel-cage induction motor (SCIM) by replacing the conventional proportional??integral (PI) controller. The fuzzy logic based controller does not require any identification of motor dynamic to control its speed and also assures the(More)
This paper proposes a generic multi-dimensional scan shift control concept for multiple scan chain design. Multiple scan chain test scheme provides very low scan power by skipping (selectively load/unload) many long scan chain switching activities. Based on the two-dimensional scan shift control, we can achieve low test power with simple and small overhead(More)
In this paper, a low noise and robust test scheme for 3D stacked integrated circuits based on modified standard IEEE 1149.4 has been proposed. Through the modified standard, this novel test scheme can be more robust to fulfill the microsystem integration requirements. This test scheme also makes the analog pins more observable and testable during and after(More)