Cheng-Tang Huang

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In situ SiO<inf>2</inf>-doped SnO<inf>2</inf> thin films have been prepared by liquid phase deposition method. The effect of SiO<inf>2</inf> additive on the surface morphology and crystalline structural of the thin films were investigated by grazing incident angle X-ray diffraction (GIAXRD) and scanning electron microscopy (SEM). In the characteristics of(More)
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