Cheng-En Shie

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We integrated the techniques of multi-image accumulation and multi-resolution background subtraction to detect mura defects in low-contrast and high-noised TFTLCD images. First, several images of an LCD on a moving product conveyer are contiguously captured and then a synthesized LCD image is used to calibrate the non-uniform illumination of these images.(More)
A mura detection approach based on the difference accumulation and background estimation is proposed to detect mura in the thin film transistor liquid crystal display (TFT-LCD) images. We were motivated by wavelet transform to derive a multi-resolution method for accelerating the detecting speed of background estimation. While the visibility of mura depends(More)
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