Chee Kong Leong

We don’t have enough information about this author to calculate their statistics. If you think this is an error let us know.
Learn More
Power short (PS) bin failure due to Al bridging in bond pad regions originated from Al whisker, caused severe yield loss in advanced technology nodes. A comprehensive study on circuit design impact on Al whisker bridging issue was carried out and it was found that increasing Al metal spacing reduced Al whisker bridging. Furthermore, through optimization of(More)
Voltage regulators are widely used in a circuit design nowadays. Voltage regulator failure is a critical yield loss in advanced technology nodes. Through a comprehensive study on circuit layout and process optimization, we demonstrated that voltage regulator failure can be tremendously reduced by optimizing the voltage regulators in circuit layout and using(More)
  • 1