Cheah-Shen Yap

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BACKGROUND We believe that there is a need to increase awareness, particularly among foundation year doctors, of the importance of performing a full neurological examination, including ophthalmoscopy, in medical inpatients. Following a serious unexpected incident (missed papilloedema), we implemented a multifaceted intervention, including ensuring greater(More)
Boundary scan test failures in the early phase of integrated circuit device yield engineering suggest fundamental manufacturing weaknesses and require fast response to fix the I/O connectivity, without which, chip functionality cannot be validated further. This paper presents a complete wafer-level workflow for JTAG-based boundary scan debug. We also show(More)
Conventional software scan diagnosis using Electronic Design Automation (EDA) tools and hardware diagnosis using frequency mapping technique, are established methodologies for broken scan chains fault isolation. This work proposes a diagnostic workflow that integrates both methodologies to enhance accuracy and reduce turnaround time for debug. Experimental(More)
Scan diagnosis based fault isolation technique using Electronic Design Automation (EDA) software tool is highly effective and commonly adopted for product chain and logic yield learning. For every new device introduction, prior to implementation of scan diagnosis for yield ramp, it is necessary to validate the success and accuracy of the test patterns(More)
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