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—We present a built-in self-test (BIST) approach able to detect and accurately diagnose all single and practically all multiple faulty programmable logic blocks (PLBs) in field programmable gate arrays (FPGAs) with maximum diagnostic resolution. Unlike conventional BIST, FPGA BIST does not involve any area overhead or performance degradation. We also(More)
We discuss the development of Built-In Self-Test (BIST) configurations that test all of the programmable logic and interconnect resources in the core of Xilinx 4000E, 4000XL/XLA and Spartan series Field Programmable Gate Arrays (FPGAs). While there has been prior work in BIST for these FPGAs, the fast-carry logic has not been addressed and only a small(More)
In this paper we show that an embedded FPGA core is an ideal host to implement infrastructure IP for yield improvement in a bus-based SoC. We present methods for testing, diagnosing, and repairing embedded FPGAs, for which complete testability is achieved without any area overhead or performance degradation. We show how an FPGA core can provide embedded(More)
An efficient approach is presented for Built-In Self-Test (BIST) and diagnosis of embedded cores in System on Chip (SoC) devices using an embedded Field Programmable Gate Array (FPGA) core. The approach targets multiple regular structure cores including memories, multipliers, etc., but can be used to test any set of multiple identical cores in a SoC that(More)