Changick Kim

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In this paper, we focus on the problem of finding anomalies in surface images. Despite enormous research efforts and advances, it still remains a big challenge to be solved. This paper proposes a unified approach for defect detection. Our proposed method consists of two phases: (1) global estimation and (2) local refinement. First, we roughly estimate(More)
We propose a novel algorithm to partition an image with low depth-of-field (DOF) into focused object-of-interest (OOI) and defocused background. The proposed algorithm unfolds into three steps. In the first step, we transform the low-DOF image into an appropriate feature space, in which the spatial distribution of the high-frequency components is(More)
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