Chad Adams

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We propose a new and efficient statistical-simulation-based test methodology for optimally selecting repair elements at beginning-of-life (BOL) to improve the end-of-life (EOL) functionality of memory designs. This is achieved by identifying the <i>best</i> BOL test/repair corner that maximizes EOL yield, thereby exploiting redundancy to optimize EOL(More)
DRAFT Please do not quote or distribute without permission. as well as the staffs of the Chicago Public Schools and Match Education. Thanks to Kylie Klein and Stacy Norris for their help in accessing the data we analyze here, to Amanda Norton for her valuable assistance, to for their contributions to the analysis, and especially to Nathan Hess for his(More)
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