Carol Prentice

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[1] We used high‐resolution topography to quantify the spatial distribution of scarps, linear valleys, topographic sinks, and oversteepened stream channels formed along an extensional step over on the San Andreas Fault (SAF) at Mustang Ridge, California. This location provides detail of both creeping fault landform development and complex fault zone(More)
At 28nm technology and below, hot spot prediction and process window control on production wafers have become increasingly critical to prevent sensitive pattern geometries from becoming yield limiting defects as a result of process variation. We previously established a systematic approach to identify focus-sensitive hotspots, characterize their process(More)
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