Carlos Augusto de Moraes Cruz

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This work presents a study on the behavior and effectiveness of different Fixed-Pattern Noise (FPN) calibration techniques applied to different pixel topologies operating in logarithmic mode. The purpose of such study is the establishment of a consistent way to perform fair cross comparison of the effectiveness of different FPN attenuation techniques(More)
Reliability problems such as gate-oxide voltage overstress have become a concern for CMOS circuits as the gate-oxide thickness is scaled down. Gate-oxide overstress is particularly worse for charge pump circuits because they usually operate in high voltage levels. Devising charge pump circuits that avoid such problem is far simpler for CMOS triple well(More)
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