Calin Ciufudean

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Security communication systems composed of highly reliable components may have few if any failures while undergoing heavy testing or field-usage. This paper combines (i) analysis of randomized pulse modulation schemes based on finite Markov chains with (ii) security communication systems failure as a rare event with a finite-state, discrete-parameter,(More)
Failure diagnosis in large and complex systems is a critical task. A discrete event system (DES) approach to the problem of failure diagnosis is presented in this paper. A classic solution to solve DES's diagnosis is a stochastic Petri nets. Unfortunately, the solution of a stochastic Petri net is severely restricted by the size of its underlying Markov(More)
The total harmonic distortion (THD) monitoring is an important challenge in the industrial and office building environment. The IEEE-519 and IEC 61000-3 standards limit the individual harmonics current as well as the THD for nonlinear power electronic loads. A harmonic current distortion comparative study of a classical three-phase rectifier diode (TPRD)(More)
Manufacturing Systems are becoming more and more complex and therefore it becomes a hard task to control them efficiently and in real time. Given a FMS model and a specification of the desired behaviour the goal of our work is to find an appropriate distributed controller that will perform in closed-loop with the engines according to the desired behaviour.(More)
This paper presents some IEC 61499-based solutions on modelling and implementing holons within a holonic manufacturing system. Also, an inter-holonic communication solution, based on IEC 61499 function blocks, is developed. The proposed solutions are implemented, validated and analyzed in a demonstration environment simulating a machining system.
This paper presents some models and concepts for developing smart power grid control systems based on holonic concepts and the open standards IEC 61850, IEC 61499. Along with the proposed holonic models for different levels of control, we present a simple fault protection application illustrating how the IEC 61499 artifacts can be used for modeling and(More)