• Publications
  • Influence
Source-based delay-bounded multicasting in multimedia networks
TLDR
We present a genetic algorithm for solving the delay-bounded multicast problem in multimedia communication networks. Expand
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A stochastic pattern generation and optimization framework for variation-tolerant, power-safe scan test
TLDR
A statistical framework for power-safe pattern generation is proposed, which uses process variation information, power grid topology and regional constraints on switching activity. Expand
  • 28
  • 5
At-speed transition fault testing with low speed scan enable
TLDR
A novel scan-based at-speed test is proposed which generates multiple local fast scan enable signals. Expand
  • 52
  • 4
  • PDF
PMScan : A power-managed scan for simultaneous reduction of dynamic and leakage power during scan test
TLDR
We propose a power-managed scan (PMScan) scheme which exploits the presence of adaptive voltage scaling logic to reduce test power. Expand
  • 25
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Local At-Speed Scan Enable Generation for Transition Fault Testing Using Low-Cost Testers
TLDR
We propose a scan-based at-speed methodology that generates "local" SEN signals that are guaranteed to switch in one functional clock cycle even when the external SEN signal does not change state at functional speed. Expand
  • 36
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  • PDF
Test Strategies for Low-Power Devices
TLDR
Ultra low-power devices are being developed for embedded applications in bio-medical electronics, wireless sensor networks, environment monitoring and protection, etc. Expand
  • 21
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Glitch-Aware Pattern Generation and Optimization Framework for Power-Safe Scan Test
TLDR
We propose an ATPG framework that generates power-safe scan patterns and show experimental results on some benchmark circuits. Expand
  • 35
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On Power-profiling and Pattern Generation for Power-safe Scan Tests
TLDR
In this paper, we propose a timing-based, power and layout-aware pattern generation technique that minimizes both global and localized switching activity. Expand
  • 30
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A critical-path-aware partial gating approach for test power reduction
TLDR
We propose an alternate solution where a partial set of scan cells is gated to give maximum reduction in test power within a given area constraint. Expand
  • 20
  • 2
  • PDF
Efficient implementation of ADPCM codec
TLDR
We show that using both machine-independent and machine-dependent code optimization, we can achieve up to 75% improvement in performance and 35% reduction in size. Expand
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