Cécile Engrand

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Chemometric data evaluation methods for time-of-flight secondary ion mass spectrometry (TOF-SIMS) have been tested for the characterization and classification of minerals. Potential applications of(More)
In situ microanalysis of solid samples is often performed using secondary ion mass spectrometry (SIMS) with a submicron ion probe. The destructive nature of the method makes it mandatory to prevent(More)