Brynmor J. Davis

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Journal of Modern Optics Publication details, including instructions for authors and subscription information: Optical interferometry with pulsed fields Robert W. Schoonover ab; Brynmor J. Davis b; Randy A. Bartels c; P. Scott Carney ab a Department of Electrical and Computer Engineering, University(More)
A large-aperture, electromagnetic model for coherent microscopy is presented and the inverse scattering problem is solved. Approximations to the model are developed for near-focus and far-from-focus operations. These approximations result in an image-reconstruction algorithm consistent with interferometric synthetic aperture microscopy (ISAM): this(More)
Recent developments have seen the use of scanning focused near infra-red (NIR) laser beams for fault localization and defect characterization in microelectronic failure analysis. Fault localization techniques are based on thermal stimulation and include power alteration techniques such as OBIRCH, TIVA, SEI, and tester based techniques such as RIL-SDL.(More)
[1] Many new Earth remote-sensing instruments are embracing both the advantages and added complexity that result from interferometric or fully polarimetric operation. To increase instrument understanding and functionality, a model of the signals these instruments measure is presented. A stochastic model is used as it recognizes the nondeterministic nature(More)
The use of pupil-plane filters in microscopes has been proposed as a method of producing superresolution. Here it is shown that pupil-plane filters cannot increase the support of the transfer function for a large class of optical systems, implying that resolution cannot be improved solely by adding pupil-plane filters to an instrument. However, pupil(More)
Fourier transform infrared (FT-IR) spectroscopic imaging combines the specificity of optical microscopy with the spectral selectivity of vibrational spectroscopy. There is increasing recognition that the recorded data may be dependent on the optical configuration and sample morphology in addition to its local material spectral response, but a quantitative(More)
Midinfrared (IR) microspectroscopy is widely employed for spatially localized spectral analyses. A comprehensive theoretical model for the technique, however, has not been previously proposed. In this paper, rigorous theory is presented for IR absorption microspectroscopy by using Maxwell's equations to model beam propagation. Focusing effects, material(More)
Infrared microspectroscopy is widely used for the chemical analysis of small samples. In particular, spectral properties of small cylindrical samples are important in forensic analysis, understanding relationships between microstructure and mechanical properties in fibers or fiber composites, and development of cosmetics and drugs for hair. The diameters of(More)
Interferometric synthetic aperture microscopy processing of optical coherence tomography data has been shown to allow computational focusing of en face planes that have traditionally been regarded as out of focus. It is shown that this focusing of the image also produces a defocusing effect in autocorrelation artifacts resulting from Fourier-domain data(More)
Inverse scattering for near-field scanning optical microscopy with broadband illumination Brynmor J. Davis, Jin Sun, John C. Schotland and P. Scott Carney* The Beckman Institute for Advanced Science and Technology, University of Illinois, Urbana, Illinois 61801, USA; Department of Electrical and Computer Engineering, University of Illinois, Urbana, Illinois(More)