Bruce C. Kim

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DC Built-In Self-Test for Linear Analog Circuits

Abhijit Chatterjee, Bruce C. Kim, Naveena Nagi
IEEE Design & Test of Computers
1996

An Approach for Selection of Test Points for Analog Fault Diagnosis

Low cost automatic mixed-signal board test using IEEE 1149.4

Srividya Sundar, Bruce C. Kim, +6 authors Gary Kendall
2007 IEEE International Test Conference
2007

This paper describes a low cost automatic test methodology for mixed signal boards based on IEEE 1149.4. The uniquely designed test hardware provides the access needed for measurements on a device… (More)

Fault Modeling and Multi-Tone Dither Scheme for Testing 3D TSV Defects

Sukeshwar Kannan, Bruce C. Kim, Byoungchul Ahn
J. Electronic Testing
2012

A new design for built-in self-test of 5GHz low noise amplifiers

Jee-Youl Ryu, Bruce C. Kim
IEEE International SOC Conference, 2004…
2004

This paper presents a new low-cost built-in self-test (BIST) circuit for 5GHz low noise amplifier (LNA). The BIST circuit is designed for system-on-chip (SOC) transceiver environment. The proposed… (More)

Modeling and Crosstalk Evaluation of 3-D TSV-Based Inductor With Ground TSV Shielding

Saikat Mondal, Sang-Bock Cho, Bruce C. Kim
IEEE Transactions on Very Large Scale Integration…
2017

In this paper, we present a novel through-silicon-via (TSV)-based 3-D inductor structure with ground TSV shielding for better noise performance. In addition, a circuit model is proposed for the… (More)

A Novel Low-Cost Approach to MCM Interconnect Test

Bruce C. Kim, Abhijit Chatterjee, Madhavan Swaminathan, David E. Schimmel
ITC
1995

This paper describes a novel and low-cost technique for detecting process-related interconnect faults in MCMs. This method is an alternative to existing test methods such as TDR, TD7: electron beam,… (More)

A new low-cost RF built-in self-test measurement for system-on-chip transceivers

Jee-Youl Ryu, Bruce C. Kim, Iboun Taimiya Sylla
IEEE Transactions on Instrumentation and…
2006

This paper presents a new RF built-in self-test (BIST) measurement and a new automatic-performance-compensation network for a system-on-chip (SoC) transceiver. We built a 5-GHz low noise amplifier… (More)

Low-Cost Testing of 5 GHz Low Noise Amplifiers Using New RF BIST Circuit

Jee-Youl Ryu, Bruce C. Kim
J. Electronic Testing
2005

This paper presents a new low-cost RF BIST (Built-In Self-Test) scheme that is capable of measuring input impedance, gain, noise figure and input return loss for a low noise amplifier (LNA) in RF… (More)

Automatic Diagnostic Program Generation for Mixed Signal Load Board

Kranthi K. Pinjala, Bruce C. Kim, Pramodchandran N. Variyam
ITC
2003

This paper describes a method for automatically generating diagnostic programs for mixed-signal load boards. This procedure employs a statistical method of computing Mahalanobis Distance to find… (More)

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