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—To wireless communication, it is easy to be interrupted by all sorts of factors, such as, antenna direction, transmission power, distance, nodes voltage and so on. And the reliable transmission of data is the key problem for Wireless Sensor Networks (WSN) in recent years. In former research, there are many methods which can ensure data reliable(More)
The wafer quality metrology delay is a very common phenomenon in the semiconductor manufacturing processes. Furthermore, the metrology delay is usually stochastic and time-varying, which will affect the stability and control performance of the control system. In this paper, a new kind of Run-to-Run (R2R) controller based on both Takagi-Sugeno (T-S) fuzzy(More)
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