Bettina Camin

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The in situ strain measurements during orthogonal cutting were performed to get information about the local stress state in the chip formation zone. These results will be used to verify and extend existing chip formation models. Until now the existing chip formation models, e.g. [1-3] are relying on a number of restricting preconditions, because the strain(More)
Creep damage by void nucleation and growth limits the lifetime of components subjected to loading at high temperatures. We report a combined tomography and diffraction experiment using high-energy synchrotron radiation that permitted us to follow in situ void growth and microstructure development in bulk samples. The results reveal that void growth versus(More)
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