- Full text PDF available (2)
- This year (0)
- Last 5 years (0)
- Last 10 years (1)
Journals and Conferences
The in situ strain measurements during orthogonal cutting were performed to get information about the local stress state in the chip formation zone. These results will be used to verify and extend existing chip formation models. Until now the existing chip formation models, e.g. [1-3] are relying on a number of restricting preconditions, because the strain… (More)
Creep damage by void nucleation and growth limits the lifetime of components subjected to loading at high temperatures. We report a combined tomography and diffraction experiment using high-energy synchrotron radiation that permitted us to follow in situ void growth and microstructure development in bulk samples. The results reveal that void growth versus… (More)
Creep damage evolution in AA6061+22%Al2O3 particles is observed in-situ by synchrotron radiation tomography using a miniature creep device. Reconstructions of the gauge volume of the creep samples show the particle delamination, particle fracture, void formation and growth at 340°C at various stages of the creep process.