Basilios D. Vassios

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In this paper a test method based on wavelet transformation of the measured supply current (I<inf>PS</inf>) waveforms is presented. The method is simple, offers a single-point test measurement solution and may easily be adapted to test various analog and mixed-signal systems. Experimental comparative results between the proposed method, a test method based(More)
In this paper a test method based on the wavelet transformation of the measured supply current (IPS) and load current (IL) waveforms is presented. In the wavelet analysis, the test metrics used are utilizing the initial three decomposition levels of the measured signal. Experimental comparative results between the proposed method, a test method based on the(More)
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