Barry P. Linder

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DEDICATION To my friends that encouraged me throughout high school (have all given me helpful advice at some point during my graduate career. For the countless hours we spent discussing my research, I wish to separately thank Sam Preston and Olivia Mitchell. Mark Rosenzweig and Mark Pauly, who are both on my dissertation committee, were fundamental to my(More)
Ring Oscillators (RO) have traditionally been utilized to assess the effect NBTI transistor degradation on operating frequency. RO stress results are difficult to interpret for technologies with metal gates and high-k dielectrics, since the circuit degrades from both NBTI in PFETs and PBTI in NFETs. We have successfully designed and tested specialized(More)