Bai Hong Fang

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A novel approach for testing embedded memories in complexsystems-on-a-chip (SOCs) is presented. The proposedsolution aims to balance the usage of the existing on-chipresources and dedicated design for test (DFT) hardwaresuch that the functional power constraints are not exceededduring test while trading-off the testing time againstDFT area and performance(More)
Embedded memories consume an increasing portion of the die area in deep submicron systems-on-a-chip (SOCs). Manufacturing test of embedded memories is an essential step in the SOC production that screens out the defective chips and accelerates the transition from the yield learning phase to the volume production phase of a new manufacturing technology.(More)
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