B. Straka

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This paper discusses the parameters involved in making fast and reliable quiescent current (Iddq or Issq) measurements, with particular attention to the test setup and the point of measurement. For that purpose a detailed theoretical and practical study was made of the Iddq settling behaviour in function of proper measurement instrument positioning. The(More)
The paper describes a new Digital controlled Off-Chip IDDQ Measurement Unit (DOCIMU), which provides reliable precision and relatively fast measurements, even with a high capacitive load, while the Device Under Test (DUT) is unaffected. The maximal resolution is 50nA and the accurate measurement range is 1mA. Unlike other IDDQ monitors, the DOCIMU copes(More)
The implementation of an Off-Chip IDDQ monitor to support the test of complex ASICs is presented in this paper. The monitor can be incorporated into a standard automated test equipment (ATE). It is capable of driving a 2mF capacitive load and can perform measurements of the IDDQ of a device under test (DUT) in the 0-1mA range. According to measurements the(More)
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