Aziz Machouat

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Nowadays, with the increasing complexity of new VLSI circuits, laser stimulation or emission techniques and scan-based ATPG diagnostic reach their limits in functional logic failure. To overcome these limitations, a new methodology has been established. This methodology, presented in this paper, combines the advantages of both approaches in order to improve(More)
The optical IR-OBIRCh technique is a standard failure analysis tool used to localize defects that are located at interconnects layers levels. For a functional logic failure, a failing test pattern is used to condition the device into a particular logic state to generate the failure. Commonly, the defect is detected for a set of test patterns. All test(More)
Article history: Received 30 June 2009 Available online 3 August 2009 0026-2714/$ see front matter 2009 Elsevier Ltd. A doi:10.1016/j.microrel.2009.07.021 * Corresponding author. Tel.: +33 442 685 578; fax E-mail address: (G. Haller). To determine the failing net out of a list of potential candidates provided by the ATPG diagnostic(More)
Article history: Received 1 July 2008 Received in revised form 1 July 2008 Available online 12 August 2008 0026-2714/$ see front matter 2008 Elsevier Ltd. A doi:10.1016/j.microrel.2008.07.043 * Corresponding author. Tel.: +33 442 686 852; fax E-mail address: (A. Machou Dynamic laser stimulation (DLS) techniques based on operating(More)
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