Ayed S. Al-Qahtani

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Article history: Received 4 August 2012 Received in revised form 24 October 2013 Accepted 25 October 2013 Available online 25 November 2013 With technology advancement at the nanometer scale, systems became more subjected to higher manufacturing defects and higher susceptibility to soft errors. Currently, soft errors induced by ion particles are no longer(More)
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