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—Static-timing analysis (STA) has been one of the most pervasive and successful analysis engines in the design of digital circuits for the last 20 years. However, in recent years, the increased loss of predictability in semiconductor devices has raised concern over the ability of STA to effectively model statistical variations. This has resulted in(More)
—We develop a method to estimate the variation of leakage current due to both intra-die and inter-die gate length process variability. We derive an analytical expression to estimate the probability density function (PDF) of the leakage current for stacked devices found in CMOS gates. These distributions of individual gate leakage currents are then combined(More)
We describe the impact of process variation on leakage power for a 0.18mm CMOS technology. We show that variability, manifested in L<inf>drawn</inf>, T<inf>ox</inf>, and N<inf>sub</inf>, can drastically affect the leakage current. We first present Monte Carlo-based simulation results for leakage current in various CMOS gates when the process parameters are(More)
We develop an approach to minimize total power in a dual-Vdd and dual-Vth design. The algorithm runs in two distinct phases. The first phase relies on upsizing to create slack and maximize low Vdd assignments in a backward topological manner. The second phase proceeds in a forward topological fashion and both sizes and re-assigns gates to high Vdd to enable(More)
We present the first in-depth study of the two existing algorithms, namely, Clustered Voltage Scaling (CVS) and Extended Clustered Voltage Scaling (ECVS), used for assigning the voltage supply to gates in integrated circuits having dual power supplies. We present a comparison of the achievable power savings using these algorithms on various benchmark(More)
Increasing levels of process variability in sub-100nm CMOS design has become a critical concern for performance and power constraint designs. In this paper, we propose a new statistically aware Dual-Vt and sizing optimization that considers both the variability in performance and leakage of a design. While extensive work has been performed in the past on(More)
Increasing levels of process variation in current technologies have a major impact on power and performance, and result in parametric yield loss. In this work we develop an efficient gate-level approach to accurately estimate the parametric yield defined by leakage power and delay constraints, by finding the joint probability distribution function (jpdf)(More)
We investigate the effectiveness of <i>simultaneous</i> multiple supply and threshold voltage assignment in minimizing the total power (static + dynamic) for the first time. Achievable power reductions under varying conditions are investigated, including static-power limited designs and sub-1V processes. Rules of thumb are developed for optimal Vdd's and(More)
Power dissipation is becoming the most challenging design constraint in nanometer technologies. Among various design implementation schemes, standard cell ASICs offer the best power efficiency for high-performance applications. The flexibility of ASICs allow for the use of multiple voltages and multiple thresholds to match the performance of critical(More)