Ashish Giani

Learn More
We present a new test generation procedure for sequential circuits using spectral techniques. Iterative processes of filtering via compaction and spectral analysis of the filtered test set are performed for each primary input, extracting inherent spectral information embedded within the test sequence. This information, when viewed in the frequency domain,(More)
This new method of built-in self-test (BIST) for sequential cores on a system-on-a-chip (SOC) generates test patterns using a real-time program that runs on an embedded processor. Alternatively, the same program can be run on an external low-cost tester. This program generates patterns using circuit-specific spectral information in the form of one or more(More)
We present a new test generation procedure for sequential circuits using newly traversed state and newly defectedfault inforination obtained between successive iterations of vector compaction. Two types of techniques are considered. One is based on which new states a sequential circuit is driven into, and the other is based on the new faults that are(More)
We present a new test generation procedure for sequential circuits using newly traversed state and newly detected fault information obtained between successive iterations of vector compaction. Two types of techniques are considered. One is based on the new states a sequential circuit is driven into, and the other is based on the new faults that are detected(More)
To investigate the role of rule cooperation in parallel learning we have developed and compared two parallel classifier systems. The first one, PECS, applies the punctuated equilibria model to classifier systems based upon the Michigan approach, where the genetic algorithm works at the rule level. In PECS, several classifier systems, each working on a(More)
We present a new test generation procedure for sequential circuits using spectral techniques. Iterations of lter-ing via compaction and spectral analysis of the ltered test set are performed for each primary input, extracting inherent spectral information embedded within the test sequence. This information, when viewed in the frequency domain, reveals the(More)
  • 1