Ashish Giani

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We present a new test generation procedure for sequential circuits using spectral techniques. Iterative processes of filtering via compaction and spectral analysis of the filtered test set are performed for each primary input, extracting inherent spectral information embedded within the test sequence. This information, when viewed in the frequency domain,(More)
We present a new test generation procedure for sequential circuits using newly traversed state and newly defectedfault inforination obtained between successive iterations of vector compaction. Two types of techniques are considered. One is based on which new states a sequential circuit is driven into, and the other is based on the new faults that are(More)
We present a new test generation procedure for sequential circuits using newly traversed state and newly detected fault information obtained between successive iterations of vector compaction. Two types of techniques are considered. One is based on the new states a sequential circuit is driven into, and the other is based on the new faults that are detected(More)
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