Armin Würtenberger

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Reducing test application time and test data volume are major challenges in SoC design. In the case of IP cores, where no structural information is available, a common strategy is to compress the test data T D provided by the core vendor into an encoded format T E. Only the smaller set T E is stored on the ATE, and during test the original test data T D are(More)
Store-and-generate techniques encode a given test set and regenerate the original test set during the test with the help of a decoder. Previous research has shown that run-length coding, particularly alternating run-length coding, can provide high compression ratios for the test data. However, experimental data show that longer run-lengths are distributed(More)
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