Antonina Stepacheva

We don’t have enough information about this author to calculate their statistics. If you think this is an error let us know.
Learn More
Software programs for on-wafer measurement automation of multibias S-parameters, deembedding, and extraction of MESFET and HEMT small signal models is developed. The programs are included into software system INDE-SYS-MS that is integrated with on-wafer measurement setup.
Copyright and reuse: The Warwick Research Archive Portal (WRAP) makes this work by researchers of the University of Warwick available open access under the following conditions. Copyright © and all moral rights to the version of the paper presented here belong to the individual author(s) and/or other copyright owners. To the extent reasonable and(More)
  • 1