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Software programs for on-wafer measurement automation of multibias S-parameters, deembedding, and extraction of MESFET and HEMT small signal models is developed. The programs are included into software system INDE-SYS-MS that is integrated with on-wafer measurement setup.
Copyright and reuse: The Warwick Research Archive Portal (WRAP) makes this work by researchers of the University of Warwick available open access under the following conditions. Copyright © and all moral rights to the version of the paper presented here belong to the individual author(s) and/or other copyright owners. To the extent reasonable and… (More)
Software tools for extraction of equivalent circuits of MMIC passive components are described. It is included into INDESYS-MS measurement automation system.