Antoine Reverdy

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For very deep submicron technologies, 45 nm and less, bridge defects are getting more and more complex and critical. In order to find the exact root cause, accurate defect localization, precise understanding on the nature of the defect and its impact on the fine electrical behaviour of the device are mandatory. At these ultimate technologic nodes, failure(More)
For Very Deep submicron Technologies, techniques based on the analysis of reflected laser beam properties are widely used. The Laser Voltage Imaging (LVI) technique, introduced in 2009, allows mapping frequencies through the backside of integrated circuit. In this paper, we propose a new technique based on the LVI technique to debug a scan chain related(More)
Sewage sludge production increases continuously reaching almost 20% (946 700 t 1 118 795 tons of dry matters in 2007) during the (directly or after composting). The remaining 30% was incinerated (with or without household wastes) or landfilled. Nowadays, sludge reduction is a major concern. This activity has to becom be careful to the environmental impacts(More)
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