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The robustness of the processing window for the Point-contacting by Localized Dielectric breakdown technique has been investigated. Previous results have shown that if the voltage is increased beyond the initial breakdown voltage then catastrophic breakdown will result leading to enhanced recombination. The difference between these breakdown events(More)
In this work, we demonstrated a simple method to test the point contact design and determine the Surface Recombination Velocity (SRV) of the point contact solar cells from a single PL image. The thermally grown silicon dioxide is patterned by using lithographic means. The size, pitch and pattern of the point contact opening holes are varied in order to find(More)
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