Based on two successfully and widely used control techniques in many industrial applications under normal (fault-free) operation conditions, the Gain-Scheduled Proportional-Integral-Derivative… (More)
2016 IEEE International Symposium on Circuits and…
2016
Scan based Design for Test (DfT) schemes have been in wide use to increase the testability of digital circuits. The main objective is to ensure that nodes in the Circuit Under Test (CUT) are… (More)
2012 25th IEEE Canadian Conference on Electrical…
2012
In this paper, an Active Fault-Tolerant Control (AFTC) technique is developed and applied to an unmanned quadrotor helicopter UAV (Unmanned Aerial Vehicle, known also as Qball-X4) with 6 degrees of… (More)
2017 IEEE 30th Canadian Conference on Electrical…
2017
Device identification has been considered as a main trend to maintain security in wireless communications. Specific characteristics of different components of transmitters have been recently… (More)
We describe a framework for a distributed ontology based dynamic composition and execution of services. This paper describes an extension to GloServ, an ontology-based global service discovery… (More)
Vertebral compression fractures are a significant clinical issue with an annual incidence of approximately 750,000 cases in the USA alone. Mechanical properties of vertebrae are successfully… (More)
2017 IEEE International Symposium on Circuits and…
2017
There is a tradeoff between the requirements for security and testability for a sensor node hardware. To test a sensor, it is desired to have access to the internal circuitry of the Device-Under-Test… (More)
2009 International Conference on Industrial and…
2009
This paper presents different types of Synchronous reference frame methods for real time generation of compensating current for harmonic mitigation and reactive power compensation. All the techniques… (More)