Ang Boon Chong

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On-chip variation (OCV) analysis is one of the design issues faced by STA owners in advance technology node. In the past, typical OCV analysis assumed the worst process variation at transistor(More)
Synchronizers are used in sampling an asynchronous data for digital circuits. It protects the chips from metastability failure. As mean time between failure degrade with technology scaling while chip(More)
In the early design phase, padring design is one of the critical elements in design planning. The result from padring design not only will impact packaging, board level design, power integrity and(More)
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