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A discrete wavelet transform based dynamic supply current analysis technique for detecting the catastrophic faults in analog circuits containing transistor is investigated in the paper. Some considerations due to a problem of fault localization using multiresolution approximation and the illustrative numerical example are presented.
In this paper, algorithm for parametric fault diagnosis of nonlinear, analog circuits containing MOS is presented. This method applies power supply current waveform IDD as an indicator of a device feature. Test signal is filtered using a discrete wavelet transform filter bank to obtain signal sensitive to changes of device parameters. Coefficients of the… (More)
́ Abstract. In this paper, selection of the optimum test conditions for catastrophic fault diagnosis of analog circuits containing MOS transistors is presented. The method of fault detection applies power supply current waveform IDD as an indicator of a device feature. The stimulate signal parameters and values of additional components are changed in… (More)