Alireza Haghdoost

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—Over the past few years, radiation-induced transient errors, also referred to as soft errors, have been a severe threat to the data integrity of high-end and mainstream processors. Recent studies show that cache memories are among the most vulnerable components to soft errors within high-performance processors. Accurate modeling of the Vulnerability Factor(More)
This article has been accepted for publication in a future issue of this journal, but has not been fully edited. Content may change prior to final publication. Abstract—The emergence of new memory technologies provides us with opportunity to enhance the properties of existing memory architectures. One such technology is Phase Change Memory (PCM) which(More)
Phase Change Memory (PCM) is emerging as an attractive alternative to Dynamic Random Access Memory (DRAM) in building data-intensive computing systems. PCM offers read/write performance asymmetry that makes it necessary to revisit the design of in-memory applications. In this paper, we focus on in-memory hash tables, a family of data structures with wide(More)
—Most computer systems currently consist of DRAM as main memory and hard disk drives (HDDs) as storage devices. Due to the volatile nature of DRAM, the main memory may suffer from data loss in the event of power failures or system crashes. With rapid development of new types of non-volatile memory (NVRAM), such as PCM, Memristor, and STT-RAM, it becomes(More)
In most cases authors are permitted to post their version of the article (e.g. in Word or Tex form) to their personal website or institutional repository. Authors requiring further information regarding Elsevier's archiving and manuscript policies are encouraged to visit: a b s t r a c t Reliability of the current microprocessor technology is seriously(More)
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