Alexander Schlösser

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—This work introduces a novel, automated methodology for performing functional analysis of integrated circuits (ICs), such as microcontrollers and smart cards. By selectively executing code on a given chip, the resulting optical emission images yield critical information about the chip's functional layout. Automation of the code-generation allows us to(More)
This work presents a novel low-cost optoelectronic setup for time- and spatially resolved analysis of photonic emissions and a corresponding methodology, Simple Photonic Emission Analysis (SPEA). Observing the backside of ICs, the system captures extremly weak photo-emissions from switching transistors and relates them to code running in the chip. SPEA(More)
This work presents a novel low-cost optoelectronic setup for time-and spatially resolved analysis of photonic emissions and a corresponding methodology, Simple Photonic Emission Analysis (SPEA). Observing the backside of ICs, the system captures extremly weak photo-emissions from switching transistors and relates them to program running in the chip. SPEA(More)
This work presents a novel low-cost opto-electronic setup for time-and spatially resolved analysis of photonic emissions and a corresponding methodology , Simple Photonic Emission Analysis (SPEA). Observing the backside of ICs, the system captures ex-tremly weak photoemissions from switching transistors and relates them to code running in the chip. SPEA(More)
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